Undergraduate Institution: Delaware State University
Master’s Institution: Delaware State University
Research Advisor: Anthony Johnson, PhD
Description of Research
Z-scan is a technique which is used to characterize non linear optical materials. In order to do z-scan, the quality of the beam should be very high. The z-scan is a sensitive and simple method/technique that will allow us to determine the magnitude of non-linear absorption (NLA) and the magnitude and the sign of non-linear refractive (NLR) separately for a wide range of materials. There is therefore the need to expand this database. Thus, the z-scan technique, which has the advantacge of readily measuring the sign and the type of nonlinearity is a useful tool.