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Isaac Basaldua


Electrical Engineering

Undergraduate Institution: Delaware State University

Master’s Institution: Delaware State University

Research Advisor: Anthony Johnson, PhD

Description of Research

Z-scan is a technique which is used to characterize non linear optical materials.  In order to do z-scan, the quality of the beam should be very high.  The z-scan is a sensitive and simple method/technique that will allow us to determine the magnitude of non-linear absorption (NLA) and the magnitude and the sign of non-linear refractive (NLR) separately for a wide range of materials.  There is therefore the need to expand this database.  Thus, the z-scan technique, which has the advantacge of readily measuring the sign and the type of nonlinearity is a useful tool.